Md Toufiq Hasan Anik, a Ph.D. Candidate working in the SECRETS lab at the CSEE Department under the supervision of Dr. Naghmeh Karimi, won third place in the Doctoral Thesis Competition at the VLSI Test Symposium (VTS), a flagship conference in the field of VLSI Testing, Reliability, and Security. His research topic is "Aging and Security: Friends or Foes?" He mainly focuses on the impact of device aging on the success of the physical attacks (in particular Side-Channel Analysis Attacks) that target cryptographic devices to leak sensitive data.